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Page 1
Emerging SiC Applications beyond Power Electronic Devices.
La Via F, Alquier D, Giannazzo F, Kimoto T, Neudeck P, Ou H, Roncaglia A, Saddow SE, Tudisco S. La Via F, et al. Micromachines (Basel). 2023 Jun 6;14(6):1200. doi: 10.3390/mi14061200. Micromachines (Basel). 2023. PMID: 37374785 Free PMC article. Review.
New Approaches and Understandings in the Growth of Cubic Silicon Carbide.
La Via F, Zimbone M, Bongiorno C, La Magna A, Fisicaro G, Deretzis I, Scuderi V, Calabretta C, Giannazzo F, Zielinski M, Anzalone R, Mauceri M, Crippa D, Scalise E, Marzegalli A, Sarikov A, Miglio L, Jokubavicius V, Syväjärvi M, Yakimova R, Schuh P, Schöler M, Kollmuss M, Wellmann P. La Via F, et al. Materials (Basel). 2021 Sep 16;14(18):5348. doi: 10.3390/ma14185348. Materials (Basel). 2021. PMID: 34576572 Free PMC article. Review.
Status and Prospects of Cubic Silicon Carbide Power Electronics Device Technology.
Li F, Roccaforte F, Greco G, Fiorenza P, La Via F, Pérez-Tomas A, Evans JE, Fisher CA, Monaghan FA, Mawby PA, Jennings M. Li F, et al. Among authors: la via f. Materials (Basel). 2021 Oct 5;14(19):5831. doi: 10.3390/ma14195831. Materials (Basel). 2021. PMID: 34640228 Free PMC article. Review.
Impact of Nitrogen on the Selective Closure of Stacking Faults in 3C-SiC.
Calabretta C, Scuderi V, Bongiorno C, Cannizzaro A, Anzalone R, Calcagno L, Mauceri M, Crippa D, Boninelli S, La Via F. Calabretta C, et al. Among authors: la via f. Cryst Growth Des. 2022 Aug 3;22(8):4996-5003. doi: 10.1021/acs.cgd.2c00515. Epub 2022 Jun 29. Cryst Growth Des. 2022. PMID: 35942119 Free PMC article.
Temperature Investigation on 3C-SiC Homo-Epitaxy on Four-Inch Wafers.
Anzalone R, Zimbone M, Calabretta C, Mauceri M, Alberti A, Reitano R, La Via F. Anzalone R, et al. Among authors: la via f. Materials (Basel). 2019 Oct 10;12(20):3293. doi: 10.3390/ma12203293. Materials (Basel). 2019. PMID: 31658766 Free PMC article.
SiCILIA-Silicon Carbide Detectors for Intense Luminosity Investigations and Applications.
Tudisco S, La Via F, Agodi C, Altana C, Borghi G, Boscardin M, Bussolino G, Calcagno L, Camarda M, Cappuzzello F, Carbone D, Cascino S, Casini G, Cavallaro M, Ciampi C, Cirrone G, Cuttone G, Fazzi A, Giove D, Gorini G, Labate L, Lanzalone G, Litrico G, Longo G, Lo Presti D, Mauceri M, Modica R, Moschetti M, Muoio A, Musumeci F, Pasquali G, Petringa G, Piluso N, Poggi G, Privitera S, Puglia S, Puglisi V, Rebai M, Ronchin S, Santangelo A, Stefanini A, Trifirò A, Zimbone M. Tudisco S, et al. Among authors: la via f. Sensors (Basel). 2018 Jul 15;18(7):2289. doi: 10.3390/s18072289. Sensors (Basel). 2018. PMID: 30011947 Free PMC article.
Radiation Damage by Heavy Ions in Silicon and Silicon Carbide Detectors.
Altana C, Calcagno L, Ciampi C, La Via F, Lanzalone G, Muoio A, Pasquali G, Pellegrino D, Puglia S, Rapisarda G, Tudisco S. Altana C, et al. Among authors: la via f. Sensors (Basel). 2023 Jul 19;23(14):6522. doi: 10.3390/s23146522. Sensors (Basel). 2023. PMID: 37514817 Free PMC article.
25 results