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AES investigation of inhomogenous metal-insulator samples.
Microsc Microanal. 2005 Dec;11(6):567-71. doi: 10.1017/S1431927605050658.
Microsc Microanal. 2005.
PMID: 17481335
[SIMS (secondary ion mass spectroscopy) and XPS (x-ray photoelectron spectroscopy) study of titanium implant surfaces coated with anodic titanium-oxide layer].
Suba C, Velich N, Vida G, Kovács L, Kiss G, Szabó G.
Suba C, et al. Among authors: vida g.
Fogorv Sz. 2003 Oct;96(5):197-203.
Fogorv Sz. 2003.
PMID: 14635492
Hungarian.
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