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Surpassing the Diffraction Limit in Label-Free Optical Microscopy.
Palounek D, Vala M, Bujak Ł, Kopal I, Jiříková K, Shaidiuk Y, Piliarik M. Palounek D, et al. Among authors: kopal i. ACS Photonics. 2024 Aug 27;11(10):3907-3921. doi: 10.1021/acsphotonics.4c00745. eCollection 2024 Oct 16. ACS Photonics. 2024. PMID: 39429866 Free PMC article. Review.
Identification of Upper and Lower Level Yield Strength in Materials.
Valíček J, Harničárová M, Kopal I, Palková Z, Kušnerová M, Panda A, Šepelák V. Valíček J, et al. Among authors: kopal i. Materials (Basel). 2017 Aug 23;10(9):982. doi: 10.3390/ma10090982. Materials (Basel). 2017. PMID: 28832526 Free PMC article.
17 results