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Year Number of Results
1962 1
2011 1
2012 1
2013 1
2014 1
2015 1
2016 5
2017 1
2018 2
2019 3
2020 5
2021 1
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Investigation of 1200 V SiC MOSFETs' Surge Reliability.
Li H, Wang J, Ren N, Xu H, Sheng K. Li H, et al. Among authors: sheng k. Micromachines (Basel). 2019 Jul 18;10(7):485. doi: 10.3390/mi10070485. Micromachines (Basel). 2019. PMID: 31323884 Free PMC article.
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