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Versailles Project on Advanced Materials and Standards Interlaboratory Study on Measuring the Thickness and Chemistry of Nanoparticle Coatings Using XPS and LEIS.
Belsey NA, Cant DJ, Minelli C, Araujo JR, Bock B, Brüner P, Castner DG, Ceccone G, Counsell JD, Dietrich PM, Engelhard MH, Fearn S, Galhardo CE, Kalbe H, Won Kim J, Lartundo-Rojas L, Luftman HS, Nunney TS, Pseiner J, Smith EF, Spampinato V, Sturm JM, Thomas AG, Treacy JP, Veith L, Wagstaffe M, Wang H, Wang M, Wang YC, Werner W, Yang L, Shard AG. Belsey NA, et al. Among authors: veith l. J Phys Chem C Nanomater Interfaces. 2016 Oct 27;120(42):24070-24079. doi: 10.1021/acs.jpcc.6b06713. Epub 2016 Sep 13. J Phys Chem C Nanomater Interfaces. 2016. PMID: 27818719 Free PMC article.