Search Page
Save citations to file
Email citations
Email address has not been verified. Go to
My NCBI account settings
to confirm your email and then refresh this page.
Send citations to clipboard
Add to Collections
Add to My Bibliography
Create a file for external citation management software
Your saved search
Your RSS Feed
Filters
My Custom Filters
Edit custom filtersResults by year
Table representation of search results timeline featuring number of search results per year.
| Year | Number of Results |
|---|---|
| 2013 | 1 |
| 2021 | 1 |
| 2026 | 1 |
Search Results
3 results
Results by year
Filters applied: . Clear all
It looks like you are searching for an author.
Results are currently sorted by Best Match. To see the newest results first,
change the sort order to Most Recent.
Page 1
A look underneath the SiO2/4H-SiC interface after N2O thermal treatments.
Beilstein J Nanotechnol. 2013 Apr 8;4:249-54. doi: 10.3762/bjnano.4.26. Print 2013.
Beilstein J Nanotechnol. 2013.
PMID: 23616945
Free PMC article.
High-Resolution Two-Dimensional Imaging of the 4H-SiC MOSFET Channel by Scanning Capacitance Microscopy.
Fiorenza P, Alessandrino MS, Carbone B, Russo A, Roccaforte F, Giannazzo F.
Fiorenza P, et al. Among authors: alessandrino ms.
Nanomaterials (Basel). 2021 Jun 21;11(6):1626. doi: 10.3390/nano11061626.
Nanomaterials (Basel). 2021.
PMID: 34205790
Free PMC article.
Item in Clipboard
Anisotropic redistribution of coherently de-channelled electrons around dislocations in gallium nitride revealed by 4D Scanning Transmission Electron Microscopy.
Bongiorno C, Mio AM, Sfuncia G, Alessandrino MS, Adamo S, Bottari C, Spinella CR, Nicotra G.
Bongiorno C, et al. Among authors: alessandrino ms.
Ultramicroscopy. 2026 Apr;282:114327. doi: 10.1016/j.ultramic.2026.114327. Epub 2026 Feb 2.
Ultramicroscopy. 2026.
PMID: 41671897
Free article.
Item in Clipboard
Cite
Cite
ARTICLE TYPE
ARTICLE LANGUAGE
AGE
Filters on the sidebar will be reset to the default list and any currently applied filters will be cleared.