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Challenges and Perspectives for Vertical GaN-on-Si Trench MOS Reliability: From Leakage Current Analysis to Gate Stack Optimization.
Mukherjee K, De Santi C, Borga M, Geens K, You S, Bakeroot B, Decoutere S, Diehle P, Hübner S, Altmann F, Buffolo M, Meneghesso G, Zanoni E, Meneghini M. Mukherjee K, et al. Among authors: borga m. Materials (Basel). 2021 Apr 29;14(9):2316. doi: 10.3390/ma14092316. Materials (Basel). 2021. PMID: 33946943 Free PMC article. Review.
Vertical Leakage in GaN-on-Si Stacks Investigated by a Buffer Decomposition Experiment.
Tajalli A, Borga M, Meneghini M, De Santi C, Benazzi D, Besendörfer S, Püsche R, Derluyn J, Degroote S, Germain M, Kabouche R, Abid I, Meissner E, Zanoni E, Medjdoub F, Meneghesso G. Tajalli A, et al. Among authors: borga m. Micromachines (Basel). 2020 Jan 17;11(1):101. doi: 10.3390/mi11010101. Micromachines (Basel). 2020. PMID: 31963553 Free PMC article.