Understanding metric-related pitfalls in image analysis validation.
Reinke A, Tizabi MD, Baumgartner M, Eisenmann M, Heckmann-Nötzel D, Kavur AE, Rädsch T, Sudre CH, Acion L, Antonelli M, Arbel T, Bakas S, Benis A, Blaschko MB, Buettner F, Cardoso MJ, Cheplygina V, Chen J, Christodoulou E, Cimini BA, Collins GS, Farahani K, Ferrer L, Galdran A, VAN Ginneken B, Glocker B, Godau P, Haase R, Hashimoto DA, Hoffman MM, Huisman M, Isensee F, Jannin P, Kahn CE, Kainmueller D, Kainz B, Karargyris A, Karthikesalingam A, Kenngott H, Kleesiek J, Kofler F, Kooi T, Kopp-Schneider A, Kozubek M, Kreshuk A, Kurc T, Landman BA, Litjens G, Madani A, Maier-Hein K, Martel AL, Mattson P, Meijering E, Menze B, Moons KGM, Müller H, Nichyporuk B, Nickel F, Petersen J, Rafelski SM, Rajpoot N, Reyes M, Riegler MA, Rieke N, Saez-Rodriguez J, Sánchez CI, Shetty S, Summers RM, Taha AA, Tiulpin A, Tsaftaris SA, VAN Calster B, Varoquaux G, Yaniv ZR, Jäger PF, Maier-Hein L.
Reinke A, et al. Among authors: reyes m.
ArXiv. 2023 Sep 25:arXiv:2302.01790v3. Preprint.
ArXiv. 2023.
PMID: 36945687
Free PMC article.