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Table representation of search results timeline featuring number of search results per year.
Year | Number of Results |
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2014 | 1 |
2020 | 1 |
2023 | 0 |
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Page 1
Ellipsometric characterization of inhomogeneous thin films with complicated thickness non-uniformity: application to inhomogeneous polymer-like thin films.
Opt Express. 2020 Nov 23;28(24):36796-36811. doi: 10.1364/OE.412043.
Opt Express. 2020.
PMID: 33379765
Free article.
Measurement of thickness distribution, optical constants, and roughness parameters of rough nonuniform ZnSe thin films.
Nečas D, Ohlídal I, Franta D, Ohlídal M, Čudek V, Vodák J.
Nečas D, et al. Among authors: ohlidal m.
Appl Opt. 2014 Sep 1;53(25):5606-14. doi: 10.1364/AO.53.005606.
Appl Opt. 2014.
PMID: 25321353
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