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Results by year
Table representation of search results timeline featuring number of search results per year.
Year | Number of Results |
---|---|
2007 | 1 |
2008 | 1 |
2011 | 1 |
2012 | 2 |
2014 | 1 |
2020 | 1 |
2023 | 0 |
Search Results
6 results
Results by year
Page 1
How levelling and scan line corrections ruin roughness measurement and how to prevent it.
Sci Rep. 2020 Sep 17;10(1):15294. doi: 10.1038/s41598-020-72171-8.
Sci Rep. 2020.
PMID: 32943693
Free PMC article.
Short-range six-axis interferometer controlled positioning for scanning probe microscopy.
Lazar J, Klapetek P, Valtr M, Hrabina J, Buchta Z, Cip O, Cizek M, Oulehla J, Sery M.
Lazar J, et al. Among authors: valtr m.
Sensors (Basel). 2014 Jan 7;14(1):877-86. doi: 10.3390/s140100877.
Sensors (Basel). 2014.
PMID: 24451463
Free PMC article.
Item in Clipboard
Atomic force microscopy analysis of nanoparticles in non-ideal conditions.
Klapetek P, Valtr M, Nečas D, Salyk O, Dzik P.
Klapetek P, et al. Among authors: valtr m.
Nanoscale Res Lett. 2011 Aug 30;6(1):514. doi: 10.1186/1556-276X-6-514.
Nanoscale Res Lett. 2011.
PMID: 21878120
Free PMC article.
Item in Clipboard
Voice coil-based scanning probe microscopy.
Klapetek P, Valtr M, Ducho 328 V, Sobota J.
Klapetek P, et al. Among authors: valtr m.
Nanoscale Res Lett. 2012;7(1):332. doi: 10.1186/1556-276X-7-332. Epub 2012 Jun 21.
Nanoscale Res Lett. 2012.
PMID: 22720756
Free PMC article.
Item in Clipboard
Near-field scanning optical microscope probe analysis.
Klapetek P, Bursík J, Valtr M, Martinek J.
Klapetek P, et al. Among authors: valtr m.
Ultramicroscopy. 2008 Jun;108(7):671-6. doi: 10.1016/j.ultramic.2007.10.014. Epub 2007 Nov 12.
Ultramicroscopy. 2008.
PMID: 18068903
Item in Clipboard
Non-equidistant scanning approach for millimetre-sized SPM measurements.
Klapetek P, Valtr M, Buršík P.
Klapetek P, et al. Among authors: valtr m.
Nanoscale Res Lett. 2012 Apr 11;7(1):213. doi: 10.1186/1556-276X-7-213.
Nanoscale Res Lett. 2012.
PMID: 22587490
Free PMC article.
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