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Inert ambient annealing effect on MANOS capacitor memory characteristics.
Nikolaou N, Dimitrakis P, Normand P, Skarlatos D, Giannakopoulos K, Mergia K, Ioannou-Sougleridis V, Kukli K, Niinistö J, Mizohata K, Ritala M, Leskelä M. Nikolaou N, et al. Among authors: dimitrakis p. Nanotechnology. 2015 Mar 27;26(13):134004. doi: 10.1088/0957-4484/26/13/134004. Epub 2015 Mar 12. Nanotechnology. 2015. PMID: 25764569
Impact of Line Edge Roughness on ReRAM Uniformity and Scaling.
Constantoudis V, Papavieros G, Karakolis P, Khiat A, Prodromakis T, Dimitrakis P. Constantoudis V, et al. Among authors: dimitrakis p. Materials (Basel). 2019 Nov 30;12(23):3972. doi: 10.3390/ma12233972. Materials (Basel). 2019. PMID: 31801205 Free PMC article.