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Hall-plot of the phase diagram for Ba(Fe1-xCox)2As2.
Iida K, Grinenko V, Kurth F, Ichinose A, Tsukada I, Ahrens E, Pukenas A, Chekhonin P, Skrotzki W, Teresiak A, Hühne R, Aswartham S, Wurmehl S, Mönch I, Erbe M, Hänisch J, Holzapfel B, Drechsler SL, Efremov DV. Iida K, et al. Among authors: chekhonin p. Sci Rep. 2016 Jun 22;6:28390. doi: 10.1038/srep28390. Sci Rep. 2016. PMID: 27328948 Free PMC article.
Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope.
Hieckmann E, Nacke M, Allardt M, Bodrov Y, Chekhonin P, Skrotzki W, Weber J. Hieckmann E, et al. Among authors: chekhonin p. J Vis Exp. 2016 May 28;(111):53872. doi: 10.3791/53872. J Vis Exp. 2016. PMID: 27285177 Free PMC article.