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Year Number of Results
2015 3
2017 5
2018 1
2019 2
2020 1
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Label-free SnO2 nanowire FET biosensor for protein detection.
Jakob MH, Dong B, Gutsch S, Chatelle C, Krishnaraja A, Weber W, Zacharias M. Jakob MH, et al. Among authors: gutsch s. Nanotechnology. 2017 Jun 16;28(24):245503. doi: 10.1088/1361-6528/aa7015. Epub 2017 Apr 28. Nanotechnology. 2017. PMID: 28452329
Influence of Al₂O₃ Nanoparticle Addition on a UV Cured Polyacrylate for 3D Inkjet Printing.
Graf D, Burchard S, Crespo J, Megnin C, Gutsch S, Zacharias M, Hanemann T. Graf D, et al. Among authors: gutsch s. Polymers (Basel). 2019 Apr 6;11(4):633. doi: 10.3390/polym11040633. Polymers (Basel). 2019. PMID: 30959918 Free PMC article.
Absence of free carriers in silicon nanocrystals grown from phosphorus- and boron-doped silicon-rich oxide and oxynitride.
Hiller D, López-Vidrier J, Nomoto K, Wahl M, Bock W, Chlouba T, Trojánek F, Gutsch S, Zacharias M, König D, Malý P, Kopnarski M. Hiller D, et al. Among authors: gutsch s. Beilstein J Nanotechnol. 2018 May 18;9:1501-1511. doi: 10.3762/bjnano.9.141. eCollection 2018. Beilstein J Nanotechnol. 2018. PMID: 29977683 Free PMC article.
Modulation Doping of Silicon using Aluminium-induced Acceptor States in Silicon Dioxide.
König D, Hiller D, Gutsch S, Zacharias M, Smith S. König D, et al. Among authors: gutsch s. Sci Rep. 2017 Apr 20;7:46703. doi: 10.1038/srep46703. Sci Rep. 2017. PMID: 28425460 Free PMC article.
Electron Beam Effects on Oxide Thin Films-Structure and Electrical Property Correlations.
Neelisetty KK, Mu X, Gutsch S, Vahl A, Molinari A, von Seggern F, Hansen M, Scherer T, Zacharias M, Kienle L, Chakravadhanula VK, Kübel C. Neelisetty KK, et al. Among authors: gutsch s. Microsc Microanal. 2019 Jun;25(3):592-600. doi: 10.1017/S1431927619000175. Epub 2019 Mar 4. Microsc Microanal. 2019. PMID: 30829197
Changes of the absorption cross section of Si nanocrystals with temperature and distance.
Greben M, Khoroshyy P, Gutsch S, Hiller D, Zacharias M, Valenta J. Greben M, et al. Among authors: gutsch s. Beilstein J Nanotechnol. 2017 Nov 6;8:2315-2323. doi: 10.3762/bjnano.8.231. eCollection 2017. Beilstein J Nanotechnol. 2017. PMID: 29181288 Free PMC article.
Boron-Incorporating Silicon Nanocrystals Embedded in SiO2: Absence of Free Carriers vs. B-Induced Defects.
Hiller D, López-Vidrier J, Gutsch S, Zacharias M, Wahl M, Bock W, Brodyanski A, Kopnarski M, Nomoto K, Valenta J, König D. Hiller D, et al. Among authors: gutsch s. Sci Rep. 2017 Aug 21;7(1):8337. doi: 10.1038/s41598-017-08814-0. Sci Rep. 2017. PMID: 28827565 Free PMC article.
Defect-Induced Luminescence Quenching vs. Charge Carrier Generation of Phosphorus Incorporated in Silicon Nanocrystals as Function of Size.
Hiller D, López-Vidrier J, Gutsch S, Zacharias M, Nomoto K, König D. Hiller D, et al. Among authors: gutsch s. Sci Rep. 2017 Apr 13;7(1):863. doi: 10.1038/s41598-017-01001-1. Sci Rep. 2017. PMID: 28408757 Free PMC article.
Location and Electronic Nature of Phosphorus in the Si Nanocrystal--SiO2 System.
König D, Gutsch S, Gnaser H, Wahl M, Kopnarski M, Göttlicher J, Steininger R, Zacharias M, Hiller D. König D, et al. Among authors: gutsch s. Sci Rep. 2015 May 22;5:9702. doi: 10.1038/srep09702. Sci Rep. 2015. PMID: 25997696 Free PMC article.
Observing the morphology of single-layered embedded silicon nanocrystals by using temperature-stable TEM membranes.
Gutsch S, Hiller D, Laube J, Zacharias M, Kübel C. Gutsch S, et al. Beilstein J Nanotechnol. 2015 Apr 15;6:964-70. doi: 10.3762/bjnano.6.99. eCollection 2015. Beilstein J Nanotechnol. 2015. PMID: 25977867 Free PMC article.
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