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Page 1
Investigation of Intra-Nitride Charge Migration Suppression in SONOS Flash Memory.
Micromachines (Basel). 2019 May 29;10(6):356. doi: 10.3390/mi10060356.
Micromachines (Basel). 2019.
PMID: 31146426
Free PMC article.
Additive effect of poly(4-vinylphenol) gate dielectric in organic thin film transistor at low temperature process.
Yun HJ, Baek KH, Do LM, Jeong KS, Kim YM, Yang SD, Lee SY, Lee HD, Lee GW.
Yun HJ, et al. Among authors: yang sd.
J Nanosci Nanotechnol. 2013 May;13(5):3313-6. doi: 10.1166/jnn.2013.7272.
J Nanosci Nanotechnol. 2013.
PMID: 23858850
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