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General approach to reliable characterization of thin metal films.
Amotchkina TV, Janicki V, Sancho-Parramon J, Tikhonravov AV, Trubetskov MK, Zorc H. Amotchkina TV, et al. Among authors: janicki v. Appl Opt. 2011 Apr 1;50(10):1453-64. doi: 10.1364/AO.50.001453. Appl Opt. 2011. PMID: 21460914 Free article.