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X-ray Photoelectron Spectroscopy (XPS) Depth Profiling for Evaluation of La₂Zr₂O₇ Buffer Layer Capacity.
Materials (Basel). 2012 Feb 27;5(3):364-376. doi: 10.3390/ma5030364.
Materials (Basel). 2012.
PMID: 28817051
Free PMC article.
Effects of Varied Cleaning Methods on Ni-5% W Substrate for Dip-Coating of Water-based Buffer Layers: An X-ray Photoelectron Spectroscopy Study.
Narayanan V, Bruneel E, Hühne R, Van Driessche I.
Narayanan V, et al.
Nanomaterials (Basel). 2012 Aug 9;2(3):251-267. doi: 10.3390/nano2030251.
Nanomaterials (Basel). 2012.
PMID: 28348306
Free PMC article.
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Aqueous Chemical Solution Deposition of Novel, Thick and Dense Lattice-Matched Single Buffer Layers Suitable for YBCO Coated Conductors: Preparation and Characterization.
Narayanan V, van Steenberge S, Lommens P, van Driessche I.
Narayanan V, et al.
Nanomaterials (Basel). 2012 Sep 10;2(3):298-311. doi: 10.3390/nano2030298.
Nanomaterials (Basel). 2012.
PMID: 28348310
Free PMC article.
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