Positively and negatively large Goos-Hänchen lateral displacements from a single negative layered structure

Appl Opt. 2012 Sep 20;51(27):6484-8. doi: 10.1364/AO.51.006484.

Abstract

We study the electromagnetic beam reflection from layered structures that include the so-called ε-negative and the μ-negative materials, also called single negative materials. We predict that such structures can demonstrate a giant lateral Goos-Hänchen shift of the resonant excitation of surface waves at the interface between the conventional and single negative materials, as well as due to the excitation of leaky modes in the layered structures. Then we replace the conventional layer with a left-handed layer (a material with both ε<0 and μ<0). We show that the Goos-Hänchen shift can be positive and negative depending on the type of this layer (conventional or LH material), which can support TE or TM surface waves.