Cited In for PMID: 40227001

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High-Resolution Full-Field Structural Microscopy of the Voltage-Induced Filament Formation in VO₂-Based Neuromorphic Devices.

Kisiel E, Salev P, Poudyal I, Alspaugh DJ, Carneiro F, Qiu E, Rodolakis F, Zhang Z, Shpyrko OG, Rozenberg M, Schuller IK, Islam Z, Frano A. Kisiel E, et al. ACS Nano. 2025 Apr 29;19(16):15385-15394. doi: 10.1021/acsnano.4c14696. Epub 2025 Apr 14. ACS Nano. 2025. PMID: 40227001 Free PMC article.

Percolation-Limited Threshold Switching in Strain-Graded Mott Devices.

Cho U, Lee DK, Lee S, Son J. Cho U, et al. ACS Nano. 2026 Jan 13;20(1):556-564. doi: 10.1021/acsnano.5c14101. Epub 2025 Dec 29. ACS Nano. 2026. PMID: 41466389 Free PMC article.

Thermally Activated Negative Differential Resistance VO_x Memristor with Switchable Rate and Leaky Integrate-and-Fire Spiking Dynamics.

Shih LC, Liao ZS, Cherkashinin G, Piros E, Alff L, Chen JS. Shih LC, et al. ACS Nano. 2025 Oct 28;19(42):37165-37174. doi: 10.1021/acsnano.5c11481. Epub 2025 Oct 13. ACS Nano. 2025. PMID: 41082732 Free PMC article.

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Cited In for PMID: 40227001

3 results

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