Thickness measurements of graphene oxide flakes using atomic force microscopy: results of an international interlaboratory comparison.
Bu T, Gao H, Yao Y, Wang J, Pollard AJ, Legge EJ, Clifford CA, Delvallée A, Ducourtieux S, Lawn MA, Babic B, Coleman VA, Jämting Å, Zou S, Chen M, Jakubek ZJ, Iacob E, Chanthawong N, Mongkolsuttirat K, Zeng G, Almeida CM, He BC, Hyde L, Ren L.
Bu T, et al.
Nanotechnology. 2023 Mar 16;34(22). doi: 10.1088/1361-6528/acbf58.
Nanotechnology. 2023.
PMID: 36848668
An international interlaboratory comparison on thickness measurements of graphene oxide flakes using atomic force microscopy has been completed in technical working area 41 of versailles project on advanced materials and standards. ...
An international interlaboratory comparison on thickness measurements of graphene oxide flakes using atomic force microscopy has been …