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Unraveling the Issue of Ag Migration in Printable Source/Drain Electrodes Compatible with Versatile Solution-Processed Oxide Semiconductors for Printed Thin-Film Transistor Applications.
Hong GR, Lee SS, Park HJ, Jo Y, Kim JY, Lee HS, Kang YC, Ryu BH, Song A, Chung KB, Choi Y, Jeong S. Hong GR, et al. Among authors: chung kb. ACS Appl Mater Interfaces. 2017 Apr 26;9(16):14058-14066. doi: 10.1021/acsami.7b00524. Epub 2017 Apr 14. ACS Appl Mater Interfaces. 2017. PMID: 28387501
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