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Thermal exchange radius measurement: application to nanowire thermal imaging.
Puyoo E, Grauby S, Rampnoux JM, Rouvière E, Dilhaire S. Puyoo E, et al. Among authors: dilhaire s. Rev Sci Instrum. 2010 Jul;81(7):073701. doi: 10.1063/1.3455214. Rev Sci Instrum. 2010. PMID: 20687725
Si and Ge allotrope heterostructured nanowires: experimental evaluation of the thermal conductivity reduction.
Ben Amor A, Djomani D, Fakhfakh M, Dilhaire S, Vincent L, Grauby S. Ben Amor A, et al. Among authors: dilhaire s. Nanotechnology. 2019 Sep 13;30(37):375704. doi: 10.1088/1361-6528/ab29a6. Epub 2019 Jun 13. Nanotechnology. 2019. PMID: 31195385
High-throughput heterodyne thermoreflectance: Application to thermal conductivity measurements of a Fe-Si-Ge thin film alloy library.
d'Acremont Q, Pernot G, Rampnoux JM, Furlan A, Lacroix D, Ludwig A, Dilhaire S. d'Acremont Q, et al. Among authors: dilhaire s. Rev Sci Instrum. 2017 Jul;88(7):074902. doi: 10.1063/1.4986469. Rev Sci Instrum. 2017. PMID: 28764526 Free article.
All-optical broadband ultrasonography of single cells.
Dehoux T, Abi Ghanem M, Zouani OF, Rampnoux JM, Guillet Y, Dilhaire S, Durrieu MC, Audoin B. Dehoux T, et al. Among authors: dilhaire s. Sci Rep. 2015 Mar 3;5:8650. doi: 10.1038/srep08650. Sci Rep. 2015. PMID: 25731090 Free PMC article.
Precise control of thermal conductivity at the nanoscale through individual phonon-scattering barriers.
Pernot G, Stoffel M, Savic I, Pezzoli F, Chen P, Savelli G, Jacquot A, Schumann J, Denker U, Mönch I, Deneke Ch, Schmidt OG, Rampnoux JM, Wang S, Plissonnier M, Rastelli A, Dilhaire S, Mingo N. Pernot G, et al. Among authors: dilhaire s. Nat Mater. 2010 Jun;9(6):491-5. doi: 10.1038/nmat2752. Epub 2010 May 2. Nat Mater. 2010. PMID: 20436465
Thermoreflectance temperature measurement with millimeter wave.
Pradere C, Caumes JP, BenKhemis S, Pernot G, Palomo E, Dilhaire S, Batsale JC. Pradere C, et al. Among authors: dilhaire s. Rev Sci Instrum. 2014 Jun;85(6):064904. doi: 10.1063/1.4884639. Rev Sci Instrum. 2014. PMID: 24985839
Laser scanning thermoreflectance imaging system using galvanometric mirrors for temperature measurements of microelectronic devices.
Grauby S, Salhi A, Rampnoux JM, Michel H, Claeys W, Dilhaire S. Grauby S, et al. Among authors: dilhaire s. Rev Sci Instrum. 2007 Jul;78(7):074902. doi: 10.1063/1.2757473. Rev Sci Instrum. 2007. PMID: 17672785
High speed heterodyne infrared thermography applied to thermal diffusivity identification.
Pradere C, Clerjaud L, Batsale JC, Dilhaire S. Pradere C, et al. Among authors: dilhaire s. Rev Sci Instrum. 2011 May;82(5):054901. doi: 10.1063/1.3581335. Rev Sci Instrum. 2011. PMID: 21639530
Measurement of thermally induced vibrations of microelectronic devices by use of a heterodyne electronic speckle pattern interferometry imaging technique.
Grauby S, Dilhaire S, Jorez S, Lopez LD, Rampnoux JM, Claeys W. Grauby S, et al. Among authors: dilhaire s. Appl Opt. 2003 Apr 1;42(10):1763-8. doi: 10.1364/ao.42.001763. Appl Opt. 2003. PMID: 12683753
Heterodyne lock-in thermal coupling measurements in integrated circuits: Applications to test and characterization.
Altet J, Aldrete-Vidrio E, Mateo D, Salhi A, Grauby S, Claeys W, Dilhaire S, Perpiñà X, Jordà X. Altet J, et al. Among authors: dilhaire s. Rev Sci Instrum. 2009 Feb;80(2):026101. doi: 10.1063/1.3073963. Rev Sci Instrum. 2009. PMID: 19256677
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