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Effects of tilt on high-resolution ADF-STEM imaging.
Maccagnano-Zacher SE, Mkhoyan KA, Kirkland EJ, Silcox J. Maccagnano-Zacher SE, et al. Among authors: kirkland ej. Ultramicroscopy. 2008 Jul;108(8):718-26. doi: 10.1016/j.ultramic.2007.11.003. Epub 2007 Nov 13. Ultramicroscopy. 2008. PMID: 18160220
Effects of amorphous layers on ADF-STEM imaging.
Mkhoyan KA, Maccagnano-Zacher SE, Kirkland EJ, Silcox J. Mkhoyan KA, et al. Among authors: kirkland ej. Ultramicroscopy. 2008 Jul;108(8):791-803. doi: 10.1016/j.ultramic.2008.01.007. Epub 2008 Feb 14. Ultramicroscopy. 2008. PMID: 18374489
Fine tuning an aberration corrected ADF-STEM.
Kirkland EJ. Kirkland EJ. Ultramicroscopy. 2018 Mar;186:62-65. doi: 10.1016/j.ultramic.2017.12.002. Epub 2017 Dec 12. Ultramicroscopy. 2018. PMID: 29268136
Room design for high-performance electron microscopy.
Muller DA, Kirkland EJ, Thomas MG, Grazul JL, Fitting L, Weyland M. Muller DA, et al. Among authors: kirkland ej. Ultramicroscopy. 2006 Oct-Nov;106(11-12):1033-40. doi: 10.1016/j.ultramic.2006.04.017. Epub 2006 Jul 5. Ultramicroscopy. 2006. PMID: 16872744
13 results