Charge-State Control of Modified Divacancies in Silicon Carbide.
Lin WX, Hu QC, Hao ZH, He ZX, Zhou JY, Sukmas W, Potiyaraj P, Xu JS, Li CF, Guo GC.
Lin WX, et al. Among authors: li cf.
Nano Lett. 2026 Feb 12. doi: 10.1021/acs.nanolett.5c05874. Online ahead of print.
Nano Lett. 2026.
PMID: 41679952