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EELS log-ratio technique for specimen-thickness measurement in the TEM.
J Electron Microsc Tech. 1988 Feb;8(2):193-200. doi: 10.1002/jemt.1060080206.
J Electron Microsc Tech. 1988.
PMID: 3246607
Ultramicrotomy of nanocrystalline materials.
McMahon G, Malis T.
McMahon G, et al. Among authors: malis t.
Microsc Res Tech. 1995 Jul 1;31(4):267-74. doi: 10.1002/jemt.1070310403.
Microsc Res Tech. 1995.
PMID: 7548999
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