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Radiation Response of Negative Gate Biased SiC MOSFETs.
Takeyama A, Makino T, Okubo S, Tanaka Y, Yoshie T, Hijikata Y, Ohshima T. Takeyama A, et al. Materials (Basel). 2019 Aug 27;12(17):2741. doi: 10.3390/ma12172741. Materials (Basel). 2019. PMID: 31461860 Free PMC article.
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