Skip to main page content
U.S. flag

An official website of the United States government

Dot gov

The .gov means it’s official.
Federal government websites often end in .gov or .mil. Before sharing sensitive information, make sure you’re on a federal government site.

Https

The site is secure.
The https:// ensures that you are connecting to the official website and that any information you provide is encrypted and transmitted securely.

Access keys NCBI Homepage MyNCBI Homepage Main Content Main Navigation

Search Page

Filters

My NCBI Filters

Text availability

Article attribute

Article type

Publication date

Search Results

550 results

Filters applied: . Clear all
Results are displayed in a computed author sort order. The Results By Year timeline is not available.
Page 1
Oxide nanoelectronics on demand.
Cen C, Thiel S, Mannhart J, Levy J. Cen C, et al. Among authors: thiel s. Science. 2009 Feb 20;323(5917):1026-30. doi: 10.1126/science.1168294. Science. 2009. PMID: 19229030
Electric field control of the LaAlO3/SrTiO3 interface ground state.
Caviglia AD, Gariglio S, Reyren N, Jaccard D, Schneider T, Gabay M, Thiel S, Hammerl G, Mannhart J, Triscone JM. Caviglia AD, et al. Among authors: thiel s. Nature. 2008 Dec 4;456(7222):624-7. doi: 10.1038/nature07576. Nature. 2008. PMID: 19052624
Electron scattering at dislocations in LaAlO3/SrTiO3 interfaces.
Thiel S, Schneider CW, Kourkoutis LF, Muller DA, Reyren N, Caviglia AD, Gariglio S, Triscone JM, Mannhart J. Thiel S, et al. Phys Rev Lett. 2009 Jan 30;102(4):046809. doi: 10.1103/PhysRevLett.102.046809. Epub 2009 Jan 30. Phys Rev Lett. 2009. PMID: 19257462
Dynamical response and confinement of the electrons at the LaAlO3/SrTiO3 interface.
Dubroka A, Rössle M, Kim KW, Malik VK, Schultz L, Thiel S, Schneider CW, Mannhart J, Herranz G, Copie O, Bibes M, Barthélémy A, Bernhard C. Dubroka A, et al. Among authors: thiel s. Phys Rev Lett. 2010 Apr 16;104(15):156807. doi: 10.1103/PhysRevLett.104.156807. Epub 2010 Apr 16. Phys Rev Lett. 2010. PMID: 20482010
Superconducting interfaces between insulating oxides.
Reyren N, Thiel S, Caviglia AD, Kourkoutis LF, Hammerl G, Richter C, Schneider CW, Kopp T, Rüetschi AS, Jaccard D, Gabay M, Muller DA, Triscone JM, Mannhart J. Reyren N, et al. Among authors: thiel s. Science. 2007 Aug 31;317(5842):1196-9. doi: 10.1126/science.1146006. Epub 2007 Aug 2. Science. 2007. PMID: 17673621
550 results