Van Aert S - Search Results

1

Real-Time Integration Center of Mass (riCOM) Reconstruction for 4D STEM.

Yu CP, Friedrich T, Jannis D, Van Aert S, Verbeeck J. Yu CP, et al. Among authors: van aert s. Microsc Microanal. 2022 Apr 25:1-12. doi: 10.1017/S1431927622000617. Online ahead of print. Microsc Microanal. 2022. PMID: 35466906

2

Model based quantification of EELS spectra.

Verbeeck J, Van Aert S. Verbeeck J, et al. Among authors: van aert s. Ultramicroscopy. 2004 Nov;101(2-4):207-24. doi: 10.1016/j.ultramic.2004.06.004. Ultramicroscopy. 2004. PMID: 15450666

3

An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic images.

Croitoru MD, Van Dyck D, Van Aert S, Bals S, Verbeeck J. Croitoru MD, et al. Among authors: van dyck d, van aert s. Ultramicroscopy. 2006 Aug-Sep;106(10):933-40. doi: 10.1016/j.ultramic.2006.04.006. Epub 2006 May 9. Ultramicroscopy. 2006. PMID: 16737777

4

Model-based quantification of EELS spectra: Including the fine structure.

Verbeeck J, Van Aert S, Bertoni G. Verbeeck J, et al. Among authors: van aert s. Ultramicroscopy. 2006 Oct-Nov;106(11-12):976-80. doi: 10.1016/j.ultramic.2006.05.006. Epub 2006 Jun 30. Ultramicroscopy. 2006. PMID: 16843599

5

Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy.

Van Aert S, Verbeeck J, Erni R, Bals S, Luysberg M, Van Dyck D, Van Tendeloo G. Van Aert S, et al. Among authors: van tendeloo g, van dyck d. Ultramicroscopy. 2009 Sep;109(10):1236-44. doi: 10.1016/j.ultramic.2009.05.010. Epub 2009 May 27. Ultramicroscopy. 2009. PMID: 19525069

6

Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy.

Martinez GT, Rosenauer A, De Backer A, Verbeeck J, Van Aert S. Martinez GT, et al. Among authors: van aert s. Ultramicroscopy. 2014 Feb;137:12-9. doi: 10.1016/j.ultramic.2013.11.001. Epub 2013 Nov 9. Ultramicroscopy. 2014. PMID: 24270003

7

The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images.

Martinez GT, De Backer A, Rosenauer A, Verbeeck J, Van Aert S. Martinez GT, et al. Among authors: van aert s. Micron. 2014 Aug;63:57-63. doi: 10.1016/j.micron.2013.12.009. Epub 2013 Dec 27. Micron. 2014. PMID: 24462219

8

Atomic resolution mapping of phonon excitations in STEM-EELS experiments.

Egoavil R, Gauquelin N, Martinez GT, Van Aert S, Van Tendeloo G, Verbeeck J. Egoavil R, et al. Among authors: van tendeloo g, van aert s. Ultramicroscopy. 2014 Dec;147:1-7. doi: 10.1016/j.ultramic.2014.04.011. Epub 2014 May 29. Ultramicroscopy. 2014. PMID: 24949597

9

Quantitative STEM normalisation: The importance of the electron flux.

Martinez GT, Jones L, De Backer A, Béché A, Verbeeck J, Van Aert S, Nellist PD. Martinez GT, et al. Among authors: van aert s. Ultramicroscopy. 2015 Dec;159 Pt 1:46-58. doi: 10.1016/j.ultramic.2015.07.010. Epub 2015 Jul 31. Ultramicroscopy. 2015. PMID: 26318098

10

Controlled lateral anisotropy in correlated manganite heterostructures by interface-engineered oxygen octahedral coupling.

Liao Z, Huijben M, Zhong Z, Gauquelin N, Macke S, Green RJ, Van Aert S, Verbeeck J, Van Tendeloo G, Held K, Sawatzky GA, Koster G, Rijnders G. Liao Z, et al. Among authors: van tendeloo g, van aert s. Nat Mater. 2016 Apr;15(4):425-31. doi: 10.1038/nmat4579. Epub 2016 Mar 7. Nat Mater. 2016. PMID: 26950593

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