PEALD of SiO2 and Al2O3 Thin Films on Polypropylene: Investigations of the Film Growth at the Interface, Stress, and Gas Barrier Properties of Dyads.
Gebhard M, Mai L, Banko L, Mitschker F, Hoppe C, Jaritz M, Kirchheim D, Zekorn C, de Los Arcos T, Grochla D, Dahlmann R, Grundmeier G, Awakowicz P, Ludwig A, Devi A.
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ACS Appl Mater Interfaces. 2018 Feb 28;10(8):7422-7434. doi: 10.1021/acsami.7b14916. Epub 2018 Feb 19.
ACS Appl Mater Interfaces. 2018.
PMID: 29338170