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A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies.
Szlachetko J, Nachtegaal M, de Boni E, Willimann M, Safonova O, Sa J, Smolentsev G, Szlachetko M, van Bokhoven JA, Dousse JC, Hoszowska J, Kayser Y, Jagodzinski P, Bergamaschi A, Schmitt B, David C, Lücke A. Szlachetko J, et al. Among authors: van bokhoven ja. Rev Sci Instrum. 2012 Oct;83(10):103105. doi: 10.1063/1.4756691. Rev Sci Instrum. 2012. PMID: 23126749
193 results