Alternating current mode scanning electrochemical microscopy (AC-SECM) enables local detection of electrochemical surface activity without any redox mediator present in solution. Z-approach curves toward the substrate result in a negative feedback curve of the ac signal for insulating samples. On conducting samples, however, the shape of the feedback curve was found to be dependent on the ac perturbation frequency. Approach curves over a wide range of frequencies were performed, and the results were applied to interpret laterally resolved frequency-dependent measurements obtained with combined atomic force microscopy-AC-SECM (AFM-AC-SECM). For the first time, this frequency dependence of the signal was utilized to fine-tune the electrochemical contrast in lateral imaging in AC-SECM. An array of gold microelectrodes embedded in silicon nitride displaying significant changes in electrochemical activity as well as in topography was investigated using a bifunctional AFM-SECM tip with an integrated recessed ring microelectrode. Due to the unique geometrical conditions the electrochemical contrast between the conducting gold spots and the insulating SixNy is reversed, crosses zero, and inverts as a function of the applied ac frequency.