Quantitative Analysis of Transition Metal Oxides at Low Accelerating Voltage with the Soft X-ray Emission Spectrometer
Microsc Microanal
.
2023 Jul 22;29(Supplement_1):178-180.
doi: 10.1093/micmic/ozad067.080.
Authors
Masaru Takakura
1
,
Takanori Murano
1
,
Shogo Koshiya
1
,
Peter McSwiggen
2
,
Vernon Robertson
2
Affiliations
1
SA Business Unit JEOL Ltd., Akishima, Tokyo, Japan.
2
JEOL USA Inc., Peabody, MA, United States.
PMID:
37613567
DOI:
10.1093/micmic/ozad067.080
No abstract available