Atomic-Level Insights into the Radiation Damage and Recovery of β-Ga2O3 for High-performance Semiconductors
Microsc Microanal
.
2023 Jul 22;29(Supplement_1):1472-1473.
doi: 10.1093/micmic/ozad067.756.
Authors
Hsien-Lien Huang
1
,
Christopher Chae
1
,
Jared M Johnson
1
,
Alexander Senckowski
2
,
Shivam Sharma
3
,
Uttam Singisetti
3
,
Man Hoi Wong
2
,
Jinwoo Hwang
1
Affiliations
1
Department of Materials Science and Engineering, The Ohio State University, Columbus, OH, United States.
2
Department of Electrical and Computer Engineering, University of Massachusetts Lowell, Lowell, MA, United States.
3
Electrical Engineering Department, University at Buffalo, Buffalo, NY, United States.
PMID:
37613602
DOI:
10.1093/micmic/ozad067.756
No abstract available