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Measurement of the excited-state lifetime of a microelectronic circuit.
Lehnert KW, Bladh K, Spietz LF, Gunnarsson D, Schuster DI, Delsing P, Schoelkopf RJ. Lehnert KW, et al. Among authors: delsing p. Phys Rev Lett. 2003 Jan 17;90(2):027002. doi: 10.1103/PhysRevLett.90.027002. Epub 2003 Jan 17. Phys Rev Lett. 2003. PMID: 12570573
Observation of quantum capacitance in the Cooper-pair transistor.
Duty T, Johansson G, Bladh K, Gunnarsson D, Wilson C, Delsing P. Duty T, et al. Among authors: delsing p. Phys Rev Lett. 2005 Nov 11;95(20):206807. doi: 10.1103/PhysRevLett.95.206807. Epub 2005 Nov 11. Phys Rev Lett. 2005. PMID: 16384086
Collapse of thermal activation in moderately damped Josephson junctions.
Krasnov VM, Bauch T, Intiso S, Hürfeld E, Akazaki T, Takayanagi H, Delsing P. Krasnov VM, et al. Among authors: delsing p. Phys Rev Lett. 2005 Oct 7;95(15):157002. doi: 10.1103/PhysRevLett.95.157002. Epub 2005 Oct 6. Phys Rev Lett. 2005. PMID: 16241753
Breakdown of the cross-Kerr scheme for photon counting.
Fan B, Kockum AF, Combes J, Johansson G, Hoi IC, Wilson CM, Delsing P, Milburn GJ, Stace TM. Fan B, et al. Among authors: delsing p. Phys Rev Lett. 2013 Feb 1;110(5):053601. doi: 10.1103/PhysRevLett.110.053601. Epub 2013 Jan 30. Phys Rev Lett. 2013. PMID: 23414018
58 results