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Development of scanning X-ray microscopes for materials science spectromicroscopy at the Advanced Light Source.
Warwick T, Ade H, Cerasari S, Denlinger J, Franck K, Garcia A, Hayakawa S, Hitchcock A, Kikuma J, Klingler S, Kortright J, Morisson G, Moronne M, Rightor E, Rotenberg E, Seal S, Shin HJ, Steele WF, Tonner BP. Warwick T, et al. Among authors: denlinger j. J Synchrotron Radiat. 1998 May 1;5(Pt 3):1090-2. doi: 10.1107/S0909049597014283. Epub 1998 May 1. J Synchrotron Radiat. 1998. PMID: 15263755
Resonant excitation x-ray fluorescence from C60.
Guo J, Glans P, Skytt P, Wassdahl N, Nordgren J, Luo Y, gren H, Ma Y, Warwick T, Heimann P, Rotenberg E, Denlinger JD. Guo J, et al. Among authors: denlinger jd. Phys Rev B Condens Matter. 1995 Oct 15;52(15):10681-10684. doi: 10.1103/physrevb.52.10681. Phys Rev B Condens Matter. 1995. PMID: 9980143 No abstract available.
Atomic-size effects on the growth of SrF2 and (Ca,Sr)F2 on Si(111).
Denlinger JD, Olmstead MA, Rotenberg E, Patel JR, Fontes E. Denlinger JD, et al. Phys Rev B Condens Matter. 1991 Mar 15;43(9):7335-7338. doi: 10.1103/physrevb.43.7335. Phys Rev B Condens Matter. 1991. PMID: 9998205 No abstract available.
Ratio of cross sections for double to single ionization of He by 85-400 eV photons.
Dörner R, Vogt T, Mergel V V, Khemliche H, Kravis S, Cocke CL, Ullrich J, Unverzagt M, Spielberger L, Damrau M, Jagutzki O, Ali I I, Weaver B, Ullmann K, Hsu CC, Jung M, Kanter EP, Sonntag B, Prior MH, Rotenberg E, Denlinger J, Warwick T, Manson ST, Schmidt-Böcking H. Dörner R, et al. Among authors: denlinger j. Phys Rev Lett. 1996 Apr 8;76(15):2654-2657. doi: 10.1103/PhysRevLett.76.2654. Phys Rev Lett. 1996. PMID: 10060755 No abstract available.
130 results