Grutter P - Search Results

1

Detection of single-electron charging in an individual InAs quantum dot by noncontact atomic-force microscopy.

Stomp R, Miyahara Y, Schaer S, Sun Q, Guo H, Grutter P, Studenikin S, Poole P, Sachrajda A. Stomp R, et al. Among authors: grutter p. Phys Rev Lett. 2005 Feb 11;94(5):056802. doi: 10.1103/PhysRevLett.94.056802. Epub 2005 Feb 8. Phys Rev Lett. 2005. PMID: 15783674

2

Nucleation and submonolayer growth of C60 on KBr.

Burke SA, Mativetsky JM, Hoffmann R, Grütter P. Burke SA, et al. Among authors: grutter p. Phys Rev Lett. 2005 Mar 11;94(9):096102. doi: 10.1103/PhysRevLett.94.096102. Epub 2005 Mar 9. Phys Rev Lett. 2005. PMID: 15783979

3

High-aspect ratio metal tips attached to atomic force microscopy cantilevers with controlled angle, length, and radius for electrostatic force microscopy.

Cockins L, Miyahara Y, Stomp R, Grutter P. Cockins L, et al. Among authors: grutter p. Rev Sci Instrum. 2007 Nov;78(11):113706. doi: 10.1063/1.2805513. Rev Sci Instrum. 2007. PMID: 18052479

4

Strain induced dewetting of a molecular system: bimodal growth of PTCDA on NaCl.

Burke SA, Ji W, Mativetsky JM, Topple JM, Fostner S, Gao HJ, Guo H, Grütter P. Burke SA, et al. Among authors: grutter p. Phys Rev Lett. 2008 May 9;100(18):186104. doi: 10.1103/PhysRevLett.100.186104. Epub 2008 May 9. Phys Rev Lett. 2008. PMID: 18518395

5

High Q optical fiber tips for NC-AFM in liquid.

LeDue JM, Lopez-Ayon M, Burke SA, Miyahara Y, Grütter P. LeDue JM, et al. Among authors: grutter p. Nanotechnology. 2009 Jul 1;20(26):264018. doi: 10.1088/0957-4484/20/26/264018. Epub 2009 Jun 10. Nanotechnology. 2009. PMID: 19509445

6

Determination of the local contact potential difference of PTCDA on NaCl: a comparison of techniques.

Burke SA, LeDue JM, Miyahara Y, Topple JM, Fostner S, Grütter P. Burke SA, et al. Among authors: grutter p. Nanotechnology. 2009 Jul 1;20(26):264012. doi: 10.1088/0957-4484/20/26/264012. Epub 2009 Jun 10. Nanotechnology. 2009. PMID: 19509452

7

Cantilever-based sensing: the origin of surface stress and optimization strategies.

Godin M, Tabard-Cossa V, Miyahara Y, Monga T, Williams PJ, Beaulieu LY, Bruce Lennox R, Grutter P. Godin M, et al. Among authors: grutter p. Nanotechnology. 2010 Feb 19;21(7):75501. doi: 10.1088/0957-4484/21/7/075501. Epub 2010 Jan 18. Nanotechnology. 2010. PMID: 20081290

8

Strong electromechanical coupling of an atomic force microscope cantilever to a quantum dot.

Bennett SD, Cockins L, Miyahara Y, Grütter P, Clerk AA. Bennett SD, et al. Among authors: grutter p. Phys Rev Lett. 2010 Jan 8;104(1):017203. doi: 10.1103/PhysRevLett.104.017203. Epub 2010 Jan 8. Phys Rev Lett. 2010. PMID: 20366389

9

Energy levels of few-electron quantum dots imaged and characterized by atomic force microscopy.

Cockins L, Miyahara Y, Bennett SD, Clerk AA, Studenikin S, Poole P, Sachrajda A, Grutter P. Cockins L, et al. Among authors: grutter p. Proc Natl Acad Sci U S A. 2010 May 25;107(21):9496-501. doi: 10.1073/pnas.0912716107. Epub 2010 May 10. Proc Natl Acad Sci U S A. 2010. PMID: 20457938 Free PMC article.

10

Exploiting cantilever curvature for noise reduction in atomic force microscopy.

Labuda A, Grütter PH. Labuda A, et al. Rev Sci Instrum. 2011 Jan;82(1):013704. doi: 10.1063/1.3503220. Rev Sci Instrum. 2011. PMID: 21280834

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