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Development of the IES method for evaluating the color rendition of light sources.
Opt Express. 2015 Jun 15;23(12):15888-906. doi: 10.1364/OE.23.015888.
Opt Express. 2015.
PMID: 26193567
Free article.
Origin of defect-insensitive emission probability in In-containing (Al,In,Ga)N alloy semiconductors.
Chichibu SF, Uedono A, Onuma T, Haskell BA, Chakraborty A, Koyama T, Fini PT, Keller S, Denbaars SP, Speck JS, Mishra UK, Nakamura S, Yamaguchi S, Kamiyama S, Amano H, Akasaki I, Han J, Sota T.
Chichibu SF, et al. Among authors: fini pt.
Nat Mater. 2006 Oct;5(10):810-6. doi: 10.1038/nmat1726. Epub 2006 Sep 3.
Nat Mater. 2006.
PMID: 16951678
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