Method for characterization of Si waveguide propagation loss.
Moresco M, Romagnoli M, Boscolo S, Midrio M, Cherchi M, Hosseini ES, Coolbaugh D, Watts MR, Dutt B.
Moresco M, et al. Among authors: hosseini es.
Opt Express. 2013 Mar 11;21(5):5391-400. doi: 10.1364/OE.21.005391.
Opt Express. 2013.
PMID: 23482110
Free article.