Reconstruction and electronic properties of silicon nanosheets as a function of thickness.
Spencer MJ, Morishita T, Snook IK.
Spencer MJ, et al. Among authors: morishita t.
Nanoscale. 2012 Apr 28;4(9):2906-13. doi: 10.1039/c2nr30100h. Epub 2012 Apr 3.
Nanoscale. 2012.
PMID: 22473377
While Si(111) oriented nanosheets that are 0.56 nm thick (2-layers) display a novel reconstruction, classified as Si(111)-2 2 on both surface layers (T. Morishita, M. J. S. Spencer, S. P. Russo, I. K. Snook and M. Mikami, Chem. Phys. ...
While Si(111) oriented nanosheets that are 0.56 nm thick (2-layers) display a novel reconstruction, classified as Si(111)-2 2 on both surfac …