Thickness-Dependent Dielectric Screening in Few-Layer Phosphorus.
Chen C, Wang Z, Zhang B, Zhang Z, Zhang J, Cheng Y, Wu K, Zhou J.
Chen C, et al. Among authors: zhang b, zhang z, zhang j.
J Phys Chem Lett. 2023 Jun 1;14(21):4962-4969. doi: 10.1021/acs.jpclett.3c00608. Epub 2023 May 23.
J Phys Chem Lett. 2023.
PMID: 37219542