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Second Generation Small Pixel Technology Using Hybrid Bond Stacking.
Sensors (Basel). 2018 Feb 24;18(2):667. doi: 10.3390/s18020667.
Sensors (Basel). 2018.
PMID: 29495272
Free PMC article.
Quantitative TEM of point defects in Si.
Eaglesham DJ, Venezia VC, Gossmann HJ, Agarwal A.
Eaglesham DJ, et al. Among authors: venezia vc.
J Electron Microsc (Tokyo). 2000;49(2):293-8. doi: 10.1093/oxfordjournals.jmicro.a023809.
J Electron Microsc (Tokyo). 2000.
PMID: 11108052
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