Stress Buildup Upon Crystallization of GeTe Thin Films: Curvature Measurements and Modelling.
Tholapi R, Gallard M, Burle N, Guichet C, Escoubas S, Putero M, Mocuta C, Richard MI, Chahine R, Sabbione C, Bernard M, Fellouh L, Noé P, Thomas O.
Tholapi R, et al. Among authors: escoubas s.
Nanomaterials (Basel). 2020 Jun 26;10(6):1247. doi: 10.3390/nano10061247.
Nanomaterials (Basel). 2020.
PMID: 32604948
Free PMC article.