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Design of a 3000-Pixel Transition-Edge Sensor X-Ray Spectrometer for Microcircuit Tomography.
Szypryt P, Bennett DA, Boone WJ, Dagel AL, Dalton G, Doriese WB, Durkin M, Fowler JW, Garboczi EJ, Gard JD, Hilton GC, Imrek J, Jimenez ES, Kotsubo VY, Larson K, Levine ZH, Mates JAB, McArthur D, Morgan KM, Nakamura N, O'Neil GC, Ortiz NJ, Pappas CG, Reintsema CD, Schmidt DR, Swetz DS, Thompson KR, Ullom JN, Walker C, Weber JC, Wessels AL, Wheeler JW. Szypryt P, et al. Among authors: dagel al. IEEE Trans Appl Supercond. 2021;31(5):10.1109/tasc.2021.3052723. doi: 10.1109/tasc.2021.3052723. IEEE Trans Appl Supercond. 2021. PMID: 35529769 Free PMC article.
Nanoscale Three-Dimensional Imaging of Integrated Circuits Using a Scanning Electron Microscope and Transition-Edge Sensor Spectrometer.
Nakamura N, Szypryt P, Dagel AL, Alpert BK, Bennett DA, Doriese WB, Durkin M, Fowler JW, Fox DT, Gard JD, Goodner RN, Harris JZ, Hilton GC, Jimenez ES, Kernen BL, Larson KW, Levine ZH, McArthur D, Morgan KM, O'Neil GC, Ortiz NJ, Pappas CG, Reintsema CD, Schmidt DR, Schultz PA, Thompson KR, Ullom JN, Vale L, Vaughan CT, Walker C, Weber JC, Wheeler JW, Swetz DS. Nakamura N, et al. Among authors: dagel al. Sensors (Basel). 2024 Apr 30;24(9):2890. doi: 10.3390/s24092890. Sensors (Basel). 2024. PMID: 38732996 Free PMC article.