Structural relaxation and defect annihilation in pure amorphous silicon.
Roorda S, Sinke WC, Poate JM, Jacobson DC, Dierker S, Dennis BS, Eaglesham DJ, Spaepen F, Fuoss P.
Roorda S, et al. Among authors: dierker s.
Phys Rev B Condens Matter. 1991 Aug 15;44(8):3702-3725. doi: 10.1103/physrevb.44.3702.
Phys Rev B Condens Matter. 1991.
PMID: 9999999
No abstract available.