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Structural relaxation and defect annihilation in pure amorphous silicon.
Roorda S, Sinke WC, Poate JM, Jacobson DC, Dierker S, Dennis BS, Eaglesham DJ, Spaepen F, Fuoss P. Roorda S, et al. Among authors: dierker s. Phys Rev B Condens Matter. 1991 Aug 15;44(8):3702-3725. doi: 10.1103/physrevb.44.3702. Phys Rev B Condens Matter. 1991. PMID: 9999999 No abstract available.
Structure of porous Vycor glass.
Wiltzius P, Bates FS, Dierker SB, Wignall GD. Wiltzius P, et al. Among authors: dierker sb. Phys Rev A Gen Phys. 1987 Sep 15;36(6):2991-2994. doi: 10.1103/physreva.36.2991. Phys Rev A Gen Phys. 1987. PMID: 9899210 No abstract available.
Dynamics of thin tilted hexatic liquid crystal films.
Dierker SB, Pindak R. Dierker SB, et al. Phys Rev Lett. 1987 Aug 31;59(9):1002-1005. doi: 10.1103/PhysRevLett.59.1002. Phys Rev Lett. 1987. PMID: 10035934 No abstract available.
Bridge for measurement of low resistance.
Matey JR, Dierker SB, Anderson AC. Matey JR, et al. Among authors: dierker sb. Rev Sci Instrum. 1979 May;50(5):671. doi: 10.1063/1.1135875. Rev Sci Instrum. 1979. PMID: 18699582
14 results