Search Page
Save citations to file
Email citations
Send citations to clipboard
Add to Collections
Add to My Bibliography
Create a file for external citation management software
Your saved search
Your RSS Feed
Filters
Results by year
Table representation of search results timeline featuring number of search results per year.
Year | Number of Results |
---|---|
2007 | 1 |
2008 | 1 |
2014 | 1 |
2015 | 1 |
2018 | 1 |
2020 | 2 |
2023 | 0 |
Search Results
7 results
Results by year
Page 1
Spectroscopic ellipsometry of inhomogeneous thin films exhibiting thickness non-uniformity and transition layers.
Opt Express. 2020 Jan 6;28(1):160-174. doi: 10.1364/OE.28.000160.
Opt Express. 2020.
PMID: 32118947
Free article.
Ellipsometric characterization of highly non-uniform thin films with the shape of thickness non-uniformity modeled by polynomials.
Vohánka J, Franta D, Čermák M, Homola V, Buršíková V, Ohlídal I.
Vohánka J, et al. Among authors: franta d.
Opt Express. 2020 Feb 17;28(4):5492-5506. doi: 10.1364/OE.380657.
Opt Express. 2020.
PMID: 32121768
Free article.
Item in Clipboard
Universal dispersion model for characterization of optical thin films over a wide spectral range: application to hafnia.
Franta D, Nečas D, Ohlídal I.
Franta D, et al.
Appl Opt. 2015 Nov 1;54(31):9108-19. doi: 10.1364/AO.54.009108.
Appl Opt. 2015.
PMID: 26560562
Item in Clipboard
Models of dielectric response in disordered solids.
Franta D, Necas D, Zajícková L.
Franta D, et al.
Opt Express. 2007 Nov 26;15(24):16230-44. doi: 10.1364/oe.15.016230.
Opt Express. 2007.
PMID: 19550911
Free article.
Item in Clipboard
Measurement of doping profiles by a contactless method of IR reflectance under grazing incidence.
Holovský J, Remeš Z, Poruba A, Franta D, Conrad B, Abelová L, Bušek D.
Holovský J, et al. Among authors: franta d.
Rev Sci Instrum. 2018 Jun;89(6):063114. doi: 10.1063/1.5015988.
Rev Sci Instrum. 2018.
PMID: 29960568
Item in Clipboard
Influence of cross-correlation effects on the optical quantities of rough films.
Franta D, Ohlídal I, Necas D.
Franta D, et al.
Opt Express. 2008 May 26;16(11):7789-803. doi: 10.1364/oe.16.007789.
Opt Express. 2008.
PMID: 18545489
Free article.
Item in Clipboard
Measurement of thickness distribution, optical constants, and roughness parameters of rough nonuniform ZnSe thin films.
Nečas D, Ohlídal I, Franta D, Ohlídal M, Čudek V, Vodák J.
Nečas D, et al. Among authors: franta d.
Appl Opt. 2014 Sep 1;53(25):5606-14. doi: 10.1364/AO.53.005606.
Appl Opt. 2014.
PMID: 25321353
Item in Clipboard
Cite
Cite