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Some optimisation studies relevant to the production of high-purity 124I and 120gI at a small-sized cyclotron.
Appl Radiat Isot. 2003 Jan;58(1):69-78. doi: 10.1016/s0969-8043(02)00226-9.
Appl Radiat Isot. 2003.
PMID: 12485666
Improved target system for production of high purity [18F]fluorine via the 18O(p,n)18F reaction.
Hess E, Blessing G, Coenen HH, Qaim SM.
Hess E, et al. Among authors: blessing g.
Appl Radiat Isot. 2000 Jun;52(6):1431-40. doi: 10.1016/s0969-8043(99)00248-1.
Appl Radiat Isot. 2000.
PMID: 10855672
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Excitation functions of 85Rb(p,xn)(85m,g,83,82,81)Sr reactions up to 100 MeV: integral tests of cross section data, comparison of production routes of 83Sr and thick target yield of 82Sr.
Kastleiner S, Qaim SM, Nortier FM, Blessing G, van der Walt TN, Coenen HH.
Kastleiner S, et al. Among authors: blessing g.
Appl Radiat Isot. 2002 May;56(5):685-95. doi: 10.1016/s0969-8043(01)00267-6.
Appl Radiat Isot. 2002.
PMID: 11993943
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Exploring the Impact of Chitosan Composites as Artificial Organs.
Sivanesan I, Hasan N, Muthu M, Blessing G, Gopal J, Chun S, Shin J, Oh JW.
Sivanesan I, et al. Among authors: blessing g.
Polymers (Basel). 2022 Apr 13;14(8):1587. doi: 10.3390/polym14081587.
Polymers (Basel). 2022.
PMID: 35458335
Free PMC article.
Review.
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Statistical error analysis of time and polarization resolved ultrasonic measurements.
Xiang D, Hsu NN, Blessing GV.
Xiang D, et al. Among authors: blessing gv.
IEEE Trans Ultrason Ferroelectr Freq Control. 1998;45(4):1006-16. doi: 10.1109/58.710582.
IEEE Trans Ultrason Ferroelectr Freq Control. 1998.
PMID: 18244255
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Ultrasonics research in the NIST Manufacturing Engineering Laboratory.
Blessing GV, Hsu NN, Slotwinski JA, Xiang D.
Blessing GV, et al.
IEEE Trans Ultrason Ferroelectr Freq Control. 2000;47(3):630-4. doi: 10.1109/58.842050.
IEEE Trans Ultrason Ferroelectr Freq Control. 2000.
PMID: 18238590
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Acoustic emission monitoring of high speed grinding of silicon nitride.
Hwang TW, Whitenton EP, Hsu NN, Blessing GV, Evans CJ.
Hwang TW, et al. Among authors: blessing gv.
Ultrasonics. 2000 Mar;38(1-8):614-9. doi: 10.1016/s0041-624x(99)00064-5.
Ultrasonics. 2000.
PMID: 10829737
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Ultrasonic measurements of surface roughness.
Blessing GV, Slotwinski JA, Eitzen DG, Ryan HM.
Blessing GV, et al.
Appl Opt. 1993 Jul 1;32(19):3433-7. doi: 10.1364/AO.32.003433.
Appl Opt. 1993.
PMID: 20829961
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