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Sample preserving deep interface characterization technique.
Holmström E, Olovsson W, Abrikosov IA, Niklasson AM, Johansson B, Gorgoi M, Karis O, Svensson S, Schäfers F, Braun W, Ohrwall G, Andersson G, Marcellini M, Eberhardt W. Holmström E, et al. Among authors: schafers f. Phys Rev Lett. 2006 Dec 31;97(26):266106. doi: 10.1103/PhysRevLett.97.266106. Epub 2006 Dec 29. Phys Rev Lett. 2006. PMID: 17280435
Soft x-ray reflectometry, hard x-ray photoelectron spectroscopy and transmission electron microscopy investigations of the internal structure of TiO2(Ti)/SiO2/Si stacks.
Filatova EO, Kozhevnikov IV, Sokolov AA, Ubyivovk EV, Yulin S, Gorgoi M, Schäfers F. Filatova EO, et al. Among authors: schafers f. Sci Technol Adv Mater. 2012 Feb 2;13(1):015001. doi: 10.1088/1468-6996/13/1/015001. eCollection 2012 Feb. Sci Technol Adv Mater. 2012. PMID: 27877468 Free PMC article.
Observation of the x-ray magneto-optical Voigt effect.
Mertins HC, Oppeneer PM, Kunes J, Gaupp A, Abramsohn D, Schäfers F. Mertins HC, et al. Among authors: schafers f. Phys Rev Lett. 2001 Jul 23;87(4):047401. doi: 10.1103/PhysRevLett.87.047401. Epub 2001 Jul 9. Phys Rev Lett. 2001. PMID: 11461644
Soft X-ray varied-line-spacing gratings fabricated by near-field holography using an electron beam lithography-written phase mask.
Lin D, Liu Z, Dietrich K, Sokolov A, Sertsu MG, Zhou H, Huo T, Kroker S, Chen H, Qiu K, Xu X, Schäfers F, Liu Y, Kley EB, Hong Y. Lin D, et al. Among authors: schafers f. J Synchrotron Radiat. 2019 Sep 1;26(Pt 5):1782-1789. doi: 10.1107/S1600577519008245. Epub 2019 Aug 16. J Synchrotron Radiat. 2019. PMID: 31490170 Free PMC article.
Efficient high-order suppression system for a metrology beamline.
Sokolov A, Sertsu MG, Gaupp A, Lüttecke M, Schäfers F. Sokolov A, et al. Among authors: schafers f. J Synchrotron Radiat. 2018 Jan 1;25(Pt 1):100-107. doi: 10.1107/S1600577517016800. Epub 2018 Jan 1. J Synchrotron Radiat. 2018. PMID: 29271758 Free PMC article.
At-wavelength metrology facility for soft X-ray reflection optics.
Sokolov A, Bischoff P, Eggenstein F, Erko A, Gaupp A, Künstner S, Mast M, Schmidt JS, Senf F, Siewert F, Zeschke T, Schäfers F. Sokolov A, et al. Among authors: schafers f. Rev Sci Instrum. 2016 May;87(5):052005. doi: 10.1063/1.4950731. Rev Sci Instrum. 2016. PMID: 27250385
57 results